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Post-Silicon Bug Localization For Processors Using IFRA

By Sung-Boem Park, Subhasish Mitra

Communications of the ACM, Vol. 53 No. 2, Pages 106-113

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IFRA overcomes major challenges associated with a very expensive step in post-silicon validation of processors — pinpointing a bug location and the instruction sequence that exposes the bug from a system failure, such as a crash.

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