A team of researchers led by the U.K.'s University of Cambridge has developed a technique for "squeezing" visible light in order to probe nanoscale memory devices, enabling investigation into their breakdown and possible performance enhancement.
The scientists used the method to examine materials used in random-access memories while in operation, by building extremely small cavities to trap light within the device.
They utilized the tiny gap between a gold nanoparticle and a mirror to view how light changed when the device was operating correctly or malfunctioning.
The color scattered from the inner regions changed when atomic defects and minuscule oxygen bubbles were forming.
Cambridge's Giuliana Di Martino said, "This way, we can reveal the breakdown mechanisms upon cycling and open up new routes for device optimization towards large-scale technology applications."
From University of Cambridge (U.K.)
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